Four probe resistivity meter

The RTS-8 digital four-probe tester is a versatile and integrated measurement device that operates based on the four-probe method. This instrument is developed in accordance with the national standard for the physical testing of single-crystal silicon and also incorporates reference to the American ASTM standards. It is specifically designed for measuring the resistivity and sheet resistance (also known as surface resistance) of semiconductor materials. With its advanced design and precise measurement capabilities, the RTS-8 ensures high accuracy and reliability in semiconductor testing. The device is widely used in research laboratories, production lines, and quality control departments where accurate electrical property analysis is essential. Its user-friendly interface and automated functions make it suitable for both experienced engineers and new operators. Additionally, the RTS-8 supports various material types, making it a flexible and efficient tool for a wide range of semiconductor applications. Whether you're working with silicon wafers or other semiconductor materials, this instrument offers consistent performance and valuable insights into material properties.

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