EDS analysis
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The SEM-EDS analysis courseware introduces a technique that utilizes a highly focused electron beam to scan the surface of the sample under investigation. As the electron beam interacts with the material, it triggers the emission of various signals, including secondary electrons, backscattered electrons, X-rays, and even photons. These signals carry valuable information about the sample's properties. Different detection systems are used to collect these signals, and advanced software processes them to generate detailed images and data. This process allows for the visualization of the sample's morphology, microstructure, elemental composition, and even crystallographic orientation, providing a comprehensive understanding of the material at the micro and nano scale. By combining scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDS), researchers can simultaneously obtain both topographical and compositional information, making this method an essential tool in materials science, geology, and biological research.